Semi-volatile Organic Testing (SIM)

We offer comprehensive analytical testing for Semi-volatile Organic Compounds (SVOCs) using industry-standard methods such as SW-846 8270, SW-846 8270 SIM, and EPA 625/625.1.

Our semi-volatile organic testing lab routinely analyzes soils, waters, and special wastes, whether for single compounds or complex mixtures like those covered by EPA 625/625.1 and SW-846 8270.

Teklab is the trusted environmental laboratory that will meet and exceed your SVOC, BNA, and SIMS testing expectations.

Given the vast number of SVOCs in existence, local regulatory agencies may require testing for compounds that are not listed under EPA 625/625.1 or SW-846 8270. In such cases, Teklab performs rigorous validation studies to determine if your specific compound can be accurately extracted and analyzed using recognized reference methods, ensuring compliance with NELAC accreditation standards.

EPA 625/625.1 and SW-846 8270 are both methods used to analyze organic compounds in samples, but they have different purposes and typical contaminants:

EPA 625/625.1

This method analyzes a wide range of organic compounds, including pesticides, chlorinated hydrocarbons, and polynuclear aromatic hydrocarbons. The method involves extracting a sample with dichloromethane and then analyzing the extract using gas chromatography and mass spectrometry.

SW-846 8270

Method 8270D, part of the larger 8000 series for analysis of wastewaters, analyzes semi-volatile organic compounds in samples like water, soil, and solid waste. The method uses gas chromatography and mass spectrometry to determine the concentration of semi-volatile organic compounds. Typical contaminants analyzed using this method include metals, dioxins, furans, and PCBs.

→ We take our responsibilities to the environment seriously, as such, Teklab will always recommend that you contact a NELAC-accredited environmental testing laboratory; even if your BNA or PNA compound of concern is not “routinely” analyzed or in an EPA approved testing method.

 

Selective Ion Monitoring (SIM)

Many remediation projects have clean up objectives with the lowest reporting limit possible and the legal defensibility of mass spectrophotometer detection, but require high enough contamination levels to ensure reimbursement. This combination can be difficult because complex matrices can damage the mass spectrophotometer.

Since GC/MS analysis is significantly more costly, the industry has developed Selective Ion Monitoring (SIM). The SIM technique allows environmental laboratories to analyze highly complex samples with minimal dilutions which results in minimal damage to the mass spectrophotometer. That allows low reporting limits and the enhanced defensibility of mass spectrophotometer analysis.

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